THM2MS-AL – M² Measurement System Extension Set, 250 – 600 nm
THM2MS-AL – M² Measurement System Extension Set, 250 – 600 nm
- Combine with BP209 Scanning Slit Beam Profilers to Build
Complete M2 Measurement System - Mirrors for the 250 – 600 nm or 400 – 2700 nm Range
- Mounting Adapters for BC207 Camera and BP209 Scanning Slit Beam Profilers
- Includes an Alignment Laser
These extension sets are designed to convert Our Camera or Scanning Slit Beam Profilers into a fully automated, motorized M² measurement system. The M2MS-AL has internal mirrors for wavelengths between 250 – 600 nm and the M2MS has internal mirrors for wavelengths between 400 – 2700 nm. A magnetic mount at the input port allows the included AR-coated lenses to be easily switched out to optimize the system for your laser source.
Wavelength Range 250 – 600 nma
Beam Profiler Compatibilityb CMOS Camera Beam Profiler, 245 – 400 nm, Ø20 µm – Ø7.0 mm, Imperial
Internal Translation Stage Travel Range 100 mm
Internal Translation Stage Velocity (Max) 500 mm/s
Internal Translation Stage Effective Translation Range 200 mm (Total) ±100 mm (from Focal Point)
Lens Focal Length 250 mm
Optical Axis Height 70 mm (Without Additional Feet)
M² Measurement Range ≥1.0 (No Upper Limit)
Typical M² Accuracy ±5% (Depends on Optics and Alignment)
Minimum Detectable Divergence Angle <0.1 mrad
Applicable Light Sources CW, Pulseda
Typical Measurement Time 15 – 30 s (Depends on Beam Shape and Settings)
General Specifications
Size 300 mm x 175 mm x 109 mm (Without Beam Profiler)
Weight 4.2 kg (Without Beam Profiler)
