TH-BP209IR1-M – Dual Scanning Slit Beam Profiler, 500 – 1700 nm, Ø2.5 µm – Ø9 mm, Metric Online Sale

TH-BP209IR1-M – Dual Scanning Slit Beam Profiler, 500 – 1700 nm, Ø2.5 µm – Ø9 mm, Metric

TH-BP209IR1-M – Dual Scanning Slit Beam Profiler, 500 – 1700 nm, Ø2.5 µm – Ø9 mm, Metric

Wavelength Range 500 – 1700 nm

Detector Material InGaAs

Aperture Diameter 9 mm

Scan Methods Scanning Slits, Knife Edge

Slit Sizes 5 µm and 25 µm

Beam Diameter Range 2.5 µm – 9 mm

Features

• Three Dual Scanning Slit Beam Profiler Models
  • Item # THBP209VIS-M for 200 nm – 1100 nm
  • Item # THBP209IR1-M for 500 nm – 1700 nm
  • Item # THBP209IR2-M for 900 nm – 2700 nm
• High-Precision Analysis of Near-Gaussian Beam Quality
• Reconstructs 2D and Pseudo 3D Spatial Power Distribution
• Single Stand-Alone Measurement Head
• Characterizes Continuous Wave or ≥10 Hz Pulsed Laser Emission
• Scanning Speeds from 2 to 20 Hz
• User-Calibratable Power Readout (See Manual for User-Calibration Procedure)
• Dynamic Range of 78 dB
• Low-Noise Amplifier
• High-Speed USB 2.0 Interface to PC

Product Drawing